JEOL Korea Ltd.
4P04
- President나카자와 다카시
- Tel02-3438-7133
- E-mailjeol20@jeol.co.kr
- Websitehttp://www.jeol.co.kr
- Exhibit fieldNano Measurement&Analysis
introduction
We, JEOL Korea Ltd. is representing the products of JEOL Ltd. (TEM, SEM, FE-SEM, FIB, CP, EPMA, Auger, XPS, EDS, WDS, EBSD, Coating system, Sample Prep., NMR, Mass, ESR, etc) We are responsible for after sales service and contributing to the advancement of science and technology in Korea.
Major Item introduction
Scanning electron microscopes (SEM) and its abundant attachments for surface observation and analysis are one of the most active instruments at the R&D institutes and quality test sites in the world.
Energy-dispersive X-ray spectrometers that are used for elemental analysis are also developed