The Advanced Analysis and Data Center at KIST provides nano-measurement and materials characterization services using advanced analytical instruments and expert personnel. We support academia, research institutes, and industry with reliable analysis and technical consulting.

KIST’s Nano Measurement and Characterization Platform provides structural, morphological, and compositional analysis using TEM, SEM, FIB, and Cryo-EM. We support materials, semiconductor, bio, and energy R&D through expert consulting and reliable analytical data.